AppliTek exhibiting at PITTCON 2008
Published: 3/2/2008 2:34:00 PM
AppliTek is exhibiting at the Pittsburgh Conference, New Orleans March 2 - 7, with its newest developed analytics: the EXAMINER Portable Benchtop.
The in-house developed XRF analyzer aims to respond to the needs of our customers requiring not only portability but also power, speed and accuracy. The overall design is not following the current hype of pistol-like equipment, for reasons of errors caused by the scanning of the product or sample, and the inherent housing size limiting the technical possibilities.
AppliTek offers you with its product a robust, benchtop product yet designed for mobile, in-the-field applications with long operation and several communication options. Applications include: assessing soil contamination; quantitative and qualitative analysis of ores and minerals; surface scanning of metals and alloys; detection of lead in toys and toy production.
Please come and see us at the Morial Convention Center, booth # 1142